CERTIFICATE COURSE ON PATENT LANDSCAPE ANALYSIS TECHNIQUES

GIIP announces the CERTIFICATE COURSE ON PATENT LANDSCAPE ANALYSIS TECHNIQUES from 8th to 20th September 2010 Delhi and Bangalore Centers. The course will have a comprehensive coverage of analysis techniques that enables management, scientists, attorneys to take key decisions in new product development, R and D planning and strategic development.

The course will have a comprehensive coverage of analysis techniques that enables management, scientists and attorneys to take key decisions in new product development, R&D planning and strategic development. This course covers patent analysis techniques using different statistical tools, data mining and data visualization techniques; used for patent landscaping that helps in identifying competitive and technology trends. The Training also focuses on the significance and use of Landscape Analysis, for identifying ‘white spaces’ in the related techniques.

Graduates, Post Graduates with Science, Engineering or technology degrees are eligible for the course. Participants should also possess good communication and writing skills, should be capable of understanding the technical concepts and processes. At the same time, should have basic understanding of the patent laws and procedures.